Analysis of noise sources in frequency-domain fluorometry

Martin J. vandeVen; Beniamino B. Barbieri; Enrico Gratton; John S. Maier

doi:10.1117/12.58225

1 April 1992 Analysis of noise sources in frequency-domain fluorometry

Martin J. vandeVen, Beniamino B. Barbieri, Enrico Gratton, John S. Maier

Proceedings Volume 1640, Time-Resolved Laser Spectroscopy in Biochemistry III; (1992) https://doi.org/10.1117/12.58225
Event: OE/LASE '92, 1992, Los Angeles, CA, United States

Abstract

In frequency domain fluorometry, as well as all other spectroscopic techniques, the noise ultimately limits the sensitivity of the instrument and the precision of the measurement. The analysis of the sources of noise in different instruments has revealed that the noise is due to a number of different instrumental factors rather than photon statistics. The ultimate goal is to eliminate those factors to achieve a situation in which the limit is the detector intrinsic noise. We have developed a system, based on digital signal processing, in which the influence of several spurious noise sources has been reduced. A study of the range of cross-correlation frequencies used to obtain the best signal-to-noise ratio is presented.

Citation Download Citation

Martin J. vandeVen, Beniamino B. Barbieri, Enrico Gratton, and John S. Maier "Analysis of noise sources in frequency-domain fluorometry", Proc. SPIE 1640, Time-Resolved Laser Spectroscopy in Biochemistry III, (1 April 1992); https://doi.org/10.1117/12.58225

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