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1 May 1992 Substrate guided-wave holo-interferometry
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Proceedings Volume 1667, Practical Holography VI; (1992)
Event: SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology, 1992, San Jose, CA, United States
This paper describes a new tool for experimental mechanics called substrate guided wave (SGW) holo-interferometry. The approach relies on recording and reconstructing time- average, double-exposure, and real-time holograms using light waves guided to the hologram by a dielectric sheet, or substrate waveguide. The study illustrates that SGW holo- interferometry can be used to isolate the reference wavefront from the environment surrounding the hologram, and can be applied to measure the mechanical properties of the substrate itself. These attributes are discussed along with experimental work performed to develop and refine the technique.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qiang Huang, John A. Gilbert, and H. John Caulfield "Substrate guided-wave holo-interferometry", Proc. SPIE 1667, Practical Holography VI, (1 May 1992);

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