Temperature dependence of the 11H photoreflectance lineshape in an (001) In0.21Ga0.79As/GaAs single quantum well

Hao Qiang; Yufei S. Huang; Fred H. Pollak; G. D. Pettit; Jerry M. Woodall

doi:10.1117/12.60453

1 July 1992 Temperature dependence of the 11H photoreflectance lineshape in an (001) In_0.21Ga_0.79As/GaAs single quantum well

Hao Qiang, Yufei S. Huang, Fred H. Pollak, G. D. Pettit, Jerry M. Woodall

Author Affiliations +

Proceedings Volume 1678, Spectroscopic Characterization Techniques for Semiconductor Technology IV; (1992) https://doi.org/10.1117/12.60453
Event: Semiconductors '92, 1992, Somerset, NJ, United States

Abstract

The photoreflectance lineshape of the 11H exciton peak in an In_0.21Ga_0.79As/GaAs single quantum well was measured from 10 K to 500 K. In contrast to the GaAs/GaAlAs system our 10 K data exhibited no `wings' and can be fit equally well by the first-derivative of a Gaussian or Lorentzian profile. The former is probably relevant since the well material is an alloy. These results indicate that care must be taken in associating spectra without pronounced `wings' with the Lorentzian profile. The temperature dependence of the 11H linewidth, which has been fit to a Bose-Einstein expression, yields important information about the quality of the material and interface. The variation of the energy of 11H with temperature agrees with that of bulk material.

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Hao Qiang, Yufei S. Huang, Fred H. Pollak, G. D. Pettit, and Jerry M. Woodall "Temperature dependence of the 11H photoreflectance lineshape in an (001) In_0.21Ga_0.79As/GaAs single quantum well", Proc. SPIE 1678, Spectroscopic Characterization Techniques for Semiconductor Technology IV, (1 July 1992); https://doi.org/10.1117/12.60453

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