Radiation-hardened 10-bit A/D for FPA signal processing

J. Brian Murphy; Eric Kim; Michael M. Liou; John W. Yang

doi:10.1117/12.60512

1 July 1992 Radiation-hardened 10-bit A/D for FPA signal processing

J. Brian Murphy, Eric Kim, Michael M. Liou, John W. Yang

Proceedings Volume 1684, Infrared Readout Electronics; (1992) https://doi.org/10.1117/12.60512
Event: Aerospace Sensing, 1992, Orlando, FL, United States

Abstract

Radiation-hardened A/D converters suitable for converting the output of FPA signals in an SDI environment have not been readily available. Hughes developed a 10-bit, 1-MSPS, total-dose and dose-rate hard A/D converter using a proprietary radiation-hardened bulk CMOS process. This paper describes the A/D converter architecture, semiconductor process, and circuit design. Test results show over 1-Mrad(Si) total-dose tolerance and up to 7 x 10 exp 11 rad(Si)/s at 125 C dose rate without latchup. Neutron fluences up to 3 x 10 exp 14 neutrons/sq cm show negligible effects.

Citation Download Citation

J. Brian Murphy, Eric Kim, Michael M. Liou, and John W. Yang "Radiation-hardened 10-bit A/D for FPA signal processing", Proc. SPIE 1684, Infrared Readout Electronics, (1 July 1992); https://doi.org/10.1117/12.60512

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