Paper
21 September 1992 AEDC's transportable direct-write scene generation test capability
Heard S. Lowry III, Parker David Elrod, T. Chris Layne
Author Affiliations +
Abstract
A Transportable Direct Write Scene Generation (TDWSG) test capability has been developed at the Arnold Engineering Development Center (AEDC) for visible and IR focal plane array (FPA) testing which utilizes laser sources and two-axis acousto-optic deflectors. The objective of this effort is to provide a test and evaluation facility which will help reduce space sensor development risks by testing FPAs with their data subsystems against realistic mission scenarios in a space environment. The TDWSG's performance envelope covers both high- speed (100 microsecond(s) frame time) scanning and slower staring formats. A modular concept is used to address large (512 X 512 pixel) FPAs. Scene inputs can be derived from various sources including the Strategic Scene Generation Model (SSGM). A continuance of this effort is being applied toward development of a fixed-site Scene Generation Test Capability (SGTC).
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Heard S. Lowry III, Parker David Elrod, and T. Chris Layne "AEDC's transportable direct-write scene generation test capability", Proc. SPIE 1687, Characterization, Propagation, and Simulation of Sources and Backgrounds II, (21 September 1992); https://doi.org/10.1117/12.137821
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Staring arrays

Sensors

Acousto-optics

Adaptive optics

Black bodies

Computing systems

Beam shaping

Back to Top