Paper
28 August 1992 CCD modeling and design for enhanced-UV response
William G. America, Robert J. Noll, Enrique Garcia, Robert M. Dixon, Richard R. Poole, James Murphy
Author Affiliations +
Abstract
A model of back illuminated CCDs is presented that concentrates on the fields that can exist at or near the illuminated surface. The parameters that influence these fields and how they affect the device quantum efficiency are explored. We also present a design for a thinned CCD using ion implantation and KrF excimer laser anneal that is tuned for enhanced UV response.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William G. America, Robert J. Noll, Enrique Garcia, Robert M. Dixon, Richard R. Poole, and James Murphy "CCD modeling and design for enhanced-UV response", Proc. SPIE 1693, Surveillance Technologies II, (28 August 1992); https://doi.org/10.1117/12.138077
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KEYWORDS
Charge-coupled devices

Quantum efficiency

Ultraviolet radiation

Silicon

Ion implantation

Surveillance

Excimer lasers

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