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1 July 1992 Thin film diamond temperature sensor array for harsh aerospace environment
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The feasibility of using polycrystalline CVD diamond films as temperature sensors in harsh aerospace environment associated with hypersonic flights was tested using patterned diamond resistors, fabricated on flat or curved oxidized Si surfaces, as temperature sensors at temperatures between 20 and 1000 C. In this temperature range, the measured resistance was found to vary over 3 orders of magnitude and the temperature coefficient of resistance to change from 0.017/K to 0.003/K. After an annealing treatment, the resistance change was reproducible within 1 percent on the entire temperature range for short measuring times.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mohammad Aslam, Ashraf Masood, Ronald J. Fredricks, and Mike A. Tamor "Thin film diamond temperature sensor array for harsh aerospace environment", Proc. SPIE 1694, Sensors and Sensor Systems for Guidance and Navigation II, (1 July 1992);

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