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20 October 1992 X-ray imaging optics in Japan (Invited Paper)
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Proceedings Volume 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation; (1992) https://doi.org/10.1117/12.132124
Event: International Symposium on Optical Fabrication, Testing, and Surface Evaluation, 1992, Tokyo, Japan
Abstract
Some results obtained as part of a multilaboratory research project entitled `x-ray imaging optics' are presented, with emphasis on a new generation of optical components and systems designed to operate in the soft x-ray (SXR) region. Included are discussions of optical constants for various thin-film materials in the SXR region, SXR multilayers, SXR microscopes, x-ray telescopes, and metrological instrumentation for testing and characterizing SXR optical elements.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takeshi Namioka, Koujun Yamashita, Masaki Yamamoto, Tadashi Matsushita, Sadao Aoki, and Shigeru Sato "X-ray imaging optics in Japan (Invited Paper)", Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); https://doi.org/10.1117/12.132124
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