Measurement of magnetic-field depth profile in superconducting niobium film by polarized neutron reflectometry

Daniel A. Korneev; L. P. Chernenko; A. V. Petrenko; N. I. Balalykin; A. V. Skripnik

doi:10.1117/12.130636

23 November 1992 Measurement of magnetic-field depth profile in superconducting niobium film by polarized neutron reflectometry

Daniel A. Korneev, L. P. Chernenko, A. V. Petrenko, N. I. Balalykin, A. V. Skripnik

Author Affiliations +

Proceedings Volume 1738, Neutron Optical Devices and Applications; (1992) https://doi.org/10.1117/12.130636
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

The profile of the stationary magnetic field penetrating into the superconducting niobium films was measured by specular reflection of thermal polarized neutrons. At 4.9 K and at 500 Oe the field penetrates practically without attenuation into the depth of (xi) equals 28 nm near the vacuum boundary, which is connected with the nearsurface depression of the superconducting order parameter. Further, in the depth of the film, the attenuation corresponds to a London law with the decay constant (Lambda) equals 45 nm. The measurements are done on the polarized neutron spectrometer SPN at the IBR-2 pulsed reactor at Dubna.

Citation Download Citation

Daniel A. Korneev, L. P. Chernenko, A. V. Petrenko, N. I. Balalykin, and A. V. Skripnik "Measurement of magnetic-field depth profile in superconducting niobium film by polarized neutron reflectometry", Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); https://doi.org/10.1117/12.130636

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