Paper
25 February 1993 Cooled silicon crystal monochromator test results
Thomas W. Tonnessen, John R. Arthur
Author Affiliations +
Abstract
High energy insertion devices, used as x-ray monochromators on synchrotron storage rings, require high performance cooling of the primary optic. Monocrystalline materials, such as silicon, inherently provide crystal lattice properties suitable for x-ray diffraction. Silicon, provides excellent thermal and structural properties as well. Free electron lasers also require high performance heat exchanger technology for mirrors. A highly efficient approach to cooling, called `pin post cell,' was developed and fully validated in silicon. However, an additional criteria is imposed on the optic when used as a diffractive crystal. The crystalline structure of the material must not be altered during any step of fabrication. A test program has been completed which evaluated the existing fabrication technology for crystal lattice distortion. X-ray diffraction test results are presented. Currently, we are fabricating an actively cooled crystal that will undergo dynamic testing on the CHESS F2 beamline later this summer.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas W. Tonnessen and John R. Arthur "Cooled silicon crystal monochromator test results", Proc. SPIE 1739, High Heat Flux Engineering, (25 February 1993); https://doi.org/10.1117/12.140538
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Cited by 4 scholarly publications.
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KEYWORDS
Crystals

Silicon

Optical fabrication

Monochromators

X-ray diffraction

Distortion

Heat flux

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