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8 December 1992 Polarized properties of the directional-hemispherical reflectance and emissivity of an opaque surface
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The measurement of temperature of the earth's surface from space is an important remote sensing parameter and depends upon the surface emissivity. Directional-hemispherical emissivities have been measured for several different soil samples with 10 micrometers CO2 laser radiation. The CO2 laser is a possible polarized source for active remote sensing. The angular variation of the directional-hemispherical emissivity has been calculated from directional reflectance measurements for horizontal and vertical polarized CO2 radiation on different soil samples and they depended upon the polarization of the incident light. In this paper it is demonstrated that the directional-hemispherical reflectance, absorbance, and emissivity are 4 X 4 Mueller matrices. For uniform incident radiance of definite state of polarization incident on an area dA' within a projected solid angle d(Omega) ' equals Cos(Theta) 'd(omega) ' at angles ((Theta) ', (phi) ') Kirchhoff's formula relating the emissivity and reflectance involves definite sums and/or differences of Mueller matrix components of the reflectance and emissivity and depends on the polarization of the incident light. The directional-hemispherical emissivity of opaque soil samples are polarization dependent.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard A. Anderson "Polarized properties of the directional-hemispherical reflectance and emissivity of an opaque surface", Proc. SPIE 1747, Polarization and Remote Sensing, (8 December 1992);


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