Paper
18 December 1992 The Pathfinder experiment on particulates after jet spray
Werner V. Brandt, Wilfried Krone-Schmidt, Ronald V. Peterson
Author Affiliations +
Abstract
The location of particulates in and about a telescope assembly after jet spray cleaning of a contaminated primary mirror surface under vacuum conditions is determined. The Pathfinder experiment described here is designed to track both the location and level of residual particulate contamination in a simulated telescope assembly after jet spray. Silicon witness plates at various positions in the telescope mockup are used to track remaining contamination after jet spray cleaning of a severely contaminated primary mirror. Scatter measurement at a wavelength of 0.5145 microns is used to determine the contamination level of the silicon witness plates before and after jet spray cleaning. Analysis of scatter and visual particle counting data demonstrated that 99.99 percent of particles are removed. Residual particles levels inside the tube are determined to be on the order of background levels.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Werner V. Brandt, Wilfried Krone-Schmidt, and Ronald V. Peterson "The Pathfinder experiment on particulates after jet spray", Proc. SPIE 1754, Optical System Contamination: Effects, Measurement, Control III, (18 December 1992); https://doi.org/10.1117/12.140742
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Cited by 1 scholarly publication.
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KEYWORDS
Particles

Contamination

Telescopes

Bidirectional reflectance transmission function

Mirrors

Semiconducting wafers

Sensors

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