Paper
20 November 1992 Attenuated total reflectance infrared absorption in CVD diamond films
Phillip John, David K. Milne, Iain C. Drummond, John I.B. Wilson, Mike G. Jubber, James Anthony Savage
Author Affiliations +
Abstract
The infrared absorption in microwave plasma-deposited, polycrystalline diamond films has been measured for the C-H stretch-mode and the diamond two-phonon mode, giving absorption coefficients of approximately 26 and 7.5 cm-1 respectively for a 20 micrometers thin film, assuming that the whole thickness of the film is responsible. The C-H absorption band envelope has been deconvoluted into its various components, allowing some estimation of the relative importance of CH, CH2, and CH3 grouping in the films. A significant absorption at approximately 3 micrometers due to N-H has been measured in films exposed to atomic nitrogen.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Phillip John, David K. Milne, Iain C. Drummond, John I.B. Wilson, Mike G. Jubber, and James Anthony Savage "Attenuated total reflectance infrared absorption in CVD diamond films", Proc. SPIE 1759, Diamond Optics V, (20 November 1992); https://doi.org/10.1117/12.130774
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Cited by 3 scholarly publications.
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KEYWORDS
Absorption

Diamond

Hydrogen

Silicon films

Infrared radiation

Nitrogen

Chemical vapor deposition

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