Paper
10 July 1979 Effect Of Plate Substrate Quality On High Resolution Holographic Imaging
O. D. D. Soares, A. M. P. P. Leite
Author Affiliations +
Proceedings Volume 0177, Optical Information Storage; (1979) https://doi.org/10.1117/12.957244
Event: Technical Symposium East, 1979, Washington, D.C., United States
Abstract
The image quality attainable in producing holographic components depends to a great extend on the optical quality of the holographic recording medium and eventually its supporting substrate. Departure from the assumed ideal optical homogeneity and perfect geometry leads to a loss of image resolution and diffraction efficiency. The problem is analysed by recourse to a wave representation in terms of spatial frequency spectrum. The wedge phase error and the sinuosoidal perturbation are studied. The obtained results permit to derive a tolerance range for the substrate quality. Experimental interferometric methods are presented to the test of holographic plates quality.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
O. D. D. Soares and A. M. P. P. Leite "Effect Of Plate Substrate Quality On High Resolution Holographic Imaging", Proc. SPIE 0177, Optical Information Storage, (10 July 1979); https://doi.org/10.1117/12.957244
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Cited by 2 scholarly publications.
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KEYWORDS
Holography

Holograms

Image resolution

Tolerancing

Diffraction

Image quality

Data storage

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