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2 February 1993 Chalcogenide glass thin films: Z-Scan measurements of refractive index changes
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Abstract
Nonlinear properties of chacolgenide glass A52S3 thin films have been measured with a self-diffraction (Z-Scan) technique. Photostructural changes and dynamical effects have been measured.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Francesco Michelotti, Mario Bertolotti, Valentin N. Ciumash, and Andrei M. Andriesh "Chalcogenide glass thin films: Z-Scan measurements of refractive index changes", Proc. SPIE 1773, Photonics for Computers, Neural Networks, and Memories, (2 February 1993); https://doi.org/10.1117/12.983231
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