New approach to variable-angle spectroscopic ellipsometry in anisotropic uniaxial films: application to oriented polymers for nonlinear optics

Eric Toussaere; Joseph Zyss

doi:10.1117/12.141009

4 March 1993 New approach to variable-angle spectroscopic ellipsometry in anisotropic uniaxial films: application to oriented polymers for nonlinear optics

Eric Toussaere, Joseph Zyss

Author Affiliations +

Proceedings Volume 1782, Thin Films for Optical Systems; (1993) https://doi.org/10.1117/12.141009
Event: Optical Systems Design '92, 1992, Berlin, Germany

Abstract

Ellipsometric spectra of thick polymer films for non-linear optics were recorded at several angles of incidence. A non-linear regression analysis is used to compare an isotropic model to a uniaxial one. Analysis in the transparent region unambiguously points out the more suitable model, and the corresponding thickness. These results are subsequently used on all the spectrum, including the absorption domains, so as to give the complex ordinary and extraordinary indices. Relevant structural information on the polymer conformation is then inferred.

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Eric Toussaere and Joseph Zyss "New approach to variable-angle spectroscopic ellipsometry in anisotropic uniaxial films: application to oriented polymers for nonlinear optics", Proc. SPIE 1782, Thin Films for Optical Systems, (4 March 1993); https://doi.org/10.1117/12.141009

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