Paper
25 February 1993 Radiation effects on the components of optical LAN systems
Alvin S. Kanofsky, Vladimir Gershman, Warren A. Rosen
Author Affiliations +
Abstract
We have measured the effects of radiation on various optical LAN communication components. The measurements were performed with 2.5 MeV electrons from the Lehigh University Van de Graaff. The performance of the devices was monitored both during irradiation and after irradiation.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alvin S. Kanofsky, Vladimir Gershman, and Warren A. Rosen "Radiation effects on the components of optical LAN systems", Proc. SPIE 1791, Optical Materials Reliability and Testing: Benign and Adverse Environments, (25 February 1993); https://doi.org/10.1117/12.141174
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KEYWORDS
Waveguides

Radiation effects

Field effect transistors

Switches

Electrons

Receivers

Diodes

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