Fiber optic electronic speckle pattern interferometry and its application to sensors

Wei Liu; Yushan Tan; Xianglin Wang

doi:10.1117/12.131285

26 October 1992 Fiber optic electronic speckle pattern interferometry and its application to sensors

Wei Liu, Yushan Tan, Xianglin Wang

Proceedings Volume 1814, Optical Sensors; (1992) https://doi.org/10.1117/12.131285
Event: International Symposium on Optoelectronics in Computers, Communications, and Control, 1992, Hsinchu, Taiwan

Abstract

This study concentrates on using multimode and singlemode fiber in electronic speckle pattern interferometry (ESPI) to measure deformation and nondestructive testing. The advantages and disadvantages of singlemode versus multimode fiber optic components are discussed. Several experiments which research the problems of applying fiber optics to ESPI for measuring displacement, unbonded faults in the carbon/epoxy honeycomb components are introduced. A series of methods were used to achieve good contrast interference fringes. All the experimental results agree well with the theory.

Citation Download Citation

Wei Liu, Yushan Tan, and Xianglin Wang "Fiber optic electronic speckle pattern interferometry and its application to sensors", Proc. SPIE 1814, Optical Sensors, (26 October 1992); https://doi.org/10.1117/12.131285

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