Surface roughness investigations of thin film disks used in magnetic recording technology

Min Yang; Frank E. Talke

doi:10.1117/12.131330

28 October 1992 Surface roughness investigations of thin film disks used in magnetic recording technology

Min Yang, Frank E. Talke

Author Affiliations +

Proceedings Volume 1816, Electro-Optic Computer Peripherals Technology; (1992) https://doi.org/10.1117/12.131330
Event: International Symposium on Optoelectronics in Computers, Communications, and Control, 1992, Hsinchu, Taiwan

Abstract

Scanning tunneling microscopy (STM) is used to study the surface roughness of thin film magnetic recording disks obtained from various vendors. The height distributions of the disk surfaces are obtained and the bearing area curves are examined using `probability scaling.'' Skewness and kurtosis of the individual disk surfaces are calculated and deviation of the height distributions and bearing area curves from Gaussian behavior is determined. Surface roughness data from scanning tunneling microscopy measurements are compared qualitatively with those obtained from optical noncontact profilometry.

Citation Download Citation

Min Yang and Frank E. Talke "Surface roughness investigations of thin film disks used in magnetic recording technology", Proc. SPIE 1816, Electro-Optic Computer Peripherals Technology, (28 October 1992); https://doi.org/10.1117/12.131330

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