Paper
23 March 1993 Subpixel edge location shift
Peter Cencik
Author Affiliations +
Proceedings Volume 1822, Optics, Illumination, and Image Sensing for Machine Vision VII; (1993) https://doi.org/10.1117/12.141936
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States
Abstract
Subpixel accuracy gauging with solid state cameras has been of great interest in past years. Efforts to reduce errors in subpixel edge locations were directed at the subpixel interpolation technique or in the physical structure of the sensor itself. In this paper we present data which supports the opinion that the major error is caused by the sampling technique. We examine the nonlinearity of the subpixel edge location when moving the edge in equidistant steps in horizontal and vertical directions according to the solid state sensor. The relation between the virtual and physical pixels and the influence of the edge shift on the camera calibration and robot guidance are briefly discussed in this paper as well.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Cencik "Subpixel edge location shift", Proc. SPIE 1822, Optics, Illumination, and Image Sensing for Machine Vision VII, (23 March 1993); https://doi.org/10.1117/12.141936
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Cited by 2 scholarly publications.
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KEYWORDS
Sensors

Cameras

Calibration

Clocks

Frame grabbers

Solid state cameras

Solid state electronics

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