Paper
30 April 1993 Frequency standards at 1.523 μm based on 20Ne and at 1.56 μm derived from the 0.780 μm Rb frequency standard
David J. Knight, K. I. Pharaoh, Geoffrey P. Barwood, David A. Humphreys, Christopher J. Hodges, Martin Lawrence, Keith H. Cameron
Author Affiliations +
Proceedings Volume 1837, Frequency-Stabilized Lasers and Their Applications; (1993) https://doi.org/10.1117/12.143665
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States
Abstract
This paper reports experimental work towards a laboratory standard based on the 20Ne transition at 1.523 micrometers , some calibration measurements to 2.5 parts in 107 on lines of C2H2 between 1.52 and 1.545 micrometers , and investigation of a standard at 1.56 micrometers involving a CO line. Progress is described towards measurement of the latter line by frequency doubling to, and beating against, a Rb D2-line stabilized laser at 0.780 micrometers of known frequency.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David J. Knight, K. I. Pharaoh, Geoffrey P. Barwood, David A. Humphreys, Christopher J. Hodges, Martin Lawrence, and Keith H. Cameron "Frequency standards at 1.523 μm based on 20Ne and at 1.56 μm derived from the 0.780 μm Rb frequency standard", Proc. SPIE 1837, Frequency-Stabilized Lasers and Their Applications, (30 April 1993); https://doi.org/10.1117/12.143665
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Semiconductor lasers

Neon

Carbon monoxide

Rubidium

Diodes

Calibration

Gas lasers

RELATED CONTENT


Back to Top