X-ray diffraction study of LC films: generalization of Moncton-Pindac method for studies of internal diffraction maximum using reflected beam on thin film with only one free surface

Jozef Zmija; E. Michalski; Wiktor Piecek

doi:10.1117/12.156988

15 October 1993 X-ray diffraction study of LC films: generalization of Moncton-Pindac method for studies of internal diffraction maximum using reflected beam on thin film with only one free surface

Jozef Zmija, E. Michalski, Wiktor Piecek

Author Affiliations +

Proceedings Volume 1845, Liquid and Solid State Crystals: Physics, Technology and Applications; (1993) https://doi.org/10.1117/12.156988
Event: Liquid and Solid State Crystals: Physics, Technology, and Applications, 1992, Zakopane, Poland

Abstract

The chosen results of investigations of internal and external diffraction maximum, using a transmission beam to freely suspended `thick' and `thin' films of smectic LC, are presented. On the basis of these results the way to the generalization of the Moncton-Pindac method was illustrated. Our generalization of the Moncton-Pindac method can be distinguished from the other methods by study of internal diffraction maximum using reflected (instead of transmission) beam. It is important that the film placed on a heated plate has only one free surface. In commonly used methods, the investigated film has two free surfaces. Some results of diffractometer measurements are presented as examples of studies using the generalized Moncton-Pindac method. Possible experiments using this method, advantages, and inconveniences are discussed.

Citation Download Citation

Jozef Zmija, E. Michalski, and Wiktor Piecek "X-ray diffraction study of LC films: generalization of Moncton-Pindac method for studies of internal diffraction maximum using reflected beam on thin film with only one free surface", Proc. SPIE 1845, Liquid and Solid State Crystals: Physics, Technology and Applications, (15 October 1993); https://doi.org/10.1117/12.156988

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