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16 June 1993 Step-stress and life testing of multi-emitter bar lasers
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Proceedings Volume 1850, Laser Diode Technology and Applications V; (1993) https://doi.org/10.1117/12.146910
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States
Abstract
The lifetime potential of many electro-optic components is often given in literature and product data sheets based on unstated or, at best, very restricted operating conditions. Often, because of the high cost of test devices, life test equipment and the cost of conducting life tests, lifetime data is available over only limited operating ranges. Extending the operating ranges is attempted only if applications for the component demand it. This paper presents a test methodology that first establishes the maximum operating stress levels for laser devices. And then, an Experimental Design Methodology is used to model laser device lifetime as a function of those operating stresses. Adopting the intent of Test Method 5006 (Limit Testing) of MIL-STD-883, Step-Stress Operational Life Tests were conducted to 'establish the operational stress levels that will accelerate predominant failure mechanisms' for multi-emitter bar lasers. An eight cell step-stress test matrix was completed. The matrix consisted of stepping individual operating stresses while driving bar lasers in either a constant peak current or a constant peak power mode. This paper presents the results of the step-stress test matrix and provides the maximum operating stress levels for these components.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas H. Faltus "Step-stress and life testing of multi-emitter bar lasers", Proc. SPIE 1850, Laser Diode Technology and Applications V, (16 June 1993); https://doi.org/10.1117/12.146910
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