Paper
14 September 1993 X-ray beam quality effects and light diffusion modeling of screens
David P. Trauernicht, Byron R. Sever
Author Affiliations +
Abstract
The x-ray excited emission spectra of some well-known phosphor materials is examined using different x-ray beam qualities. Very thick powder samples and thinner coated screens are examined. It is observed that the emission spectra are influenced by the x-ray beam quality used if the samples are very thick. A simple light diffusion model is developed and used to understand the observed effects both qualitatively and quantitatively. It is found that very small changes in the total reflectance of the powder samples is correlated with observed spectral changes.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David P. Trauernicht and Byron R. Sever "X-ray beam quality effects and light diffusion modeling of screens", Proc. SPIE 1896, Medical Imaging 1993: Physics of Medical Imaging, (14 September 1993); https://doi.org/10.1117/12.154599
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KEYWORDS
X-rays

Reflectivity

Diffusion

Absorption

X-ray imaging

Medical imaging

Physics

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