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12 July 1993Issues in the design of systems incorporating electron bombarded CCDs
Single electron detection is desirable in systems incorporating EBCCDs. The sources of noise in single electron counting are discussed and an expression is given for the total noise.
Alice L. Reinheimer
"Issues in the design of systems incorporating electron bombarded CCDs", Proc. SPIE 1900, Charge-Coupled Devices and Solid State Optical Sensors III, (12 July 1993); https://doi.org/10.1117/12.148610
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Alice L. Reinheimer, "Issues in the design of systems incorporating electron bombarded CCDs," Proc. SPIE 1900, Charge-Coupled Devices and Solid State Optical Sensors III, (12 July 1993); https://doi.org/10.1117/12.148610