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12 July 1993 Issues in the design of systems incorporating electron bombarded CCDs
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Proceedings Volume 1900, Charge-Coupled Devices and Solid State Optical Sensors III; (1993) https://doi.org/10.1117/12.148610
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1993, San Jose, CA, United States
Abstract
Single electron detection is desirable in systems incorporating EBCCDs. The sources of noise in single electron counting are discussed and an expression is given for the total noise.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alice L. Reinheimer "Issues in the design of systems incorporating electron bombarded CCDs", Proc. SPIE 1900, Charge-Coupled Devices and Solid State Optical Sensors III, (12 July 1993); https://doi.org/10.1117/12.148610
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