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6 May 1993 Automated system for classification of defects in web materials
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Proceedings Volume 1907, Machine Vision Applications in Industrial Inspection; (1993)
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1993, San Jose, CA, United States
This paper describes the development environment for the design, implementation, and testing of an expert system for web inspection that uses adaptive digital image processing and pattern recognition to classify defects in web materials. The environment consists of four sub-systems: detection, characterization, feature analysis, and classification. Each sub-system consists of a number of modules targeted at performing specific functions. The paper discusses an example of defect classification and describes the roles of characterization, feature analysis, and classification sub-systems, including specific algorithms.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dragana P. Brzakovic, Hal E. Beck, and P. Shanmugam "Automated system for classification of defects in web materials", Proc. SPIE 1907, Machine Vision Applications in Industrial Inspection, (6 May 1993);


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