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6 May 1993 Computerized image quality inspection system
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Proceedings Volume 1907, Machine Vision Applications in Industrial Inspection; (1993) https://doi.org/10.1117/12.144818
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1993, San Jose, CA, United States
Abstract
A computerized inspection system is described, which automatically characterizes image defects, evaluates image quality statistics, and compares the result with previously stored specifications. The algorithm and implementation are focused on agreement with empirical observations, reliability, and ease of use.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Feng Ouyang "Computerized image quality inspection system", Proc. SPIE 1907, Machine Vision Applications in Industrial Inspection, (6 May 1993); https://doi.org/10.1117/12.144818
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