Translator Disclaimer
Paper
6 May 1993 Distortion and defect identification on curved objects
Author Affiliations +
Proceedings Volume 1907, Machine Vision Applications in Industrial Inspection; (1993) https://doi.org/10.1117/12.144811
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1993, San Jose, CA, United States
There is no online version at this time. The PDF is only available to people who have bought the paper or have a subscription.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anand Krishna Asundi and Marokkey R. Sajan "Distortion and defect identification on curved objects", Proc. SPIE 1907, Machine Vision Applications in Industrial Inspection, (6 May 1993); https://doi.org/10.1117/12.144811
PROCEEDINGS
6 PAGES


SHARE
Advertisement
Advertisement
KEYWORDS
RELATED CONTENT

Resolution And Overlay Of Submicron I-Line Wafer Steppers
Proceedings of SPIE (January 01 1988)
Reversible transform coding of images
Proceedings of SPIE (February 27 1996)
Dissolution behavior of novolak resins
Proceedings of SPIE (June 14 1996)
Projection optical system for a scanned LED TV display
Proceedings of SPIE (June 04 2002)
Optical lithography with 157-nm technology
Proceedings of SPIE (May 28 2004)

Back to Top