Modular Design/Assembly/Alignment Approach To An Infrared (IR) Scanning System

Robert E. Fischer

doi:10.1117/12.957885

29 November 1979 Modular Design/Assembly/Alignment Approach To An Infrared (IR) Scanning System

Robert E. Fischer

Proceedings Volume 0193, Optical Systems in Engineering I; (1979) https://doi.org/10.1117/12.957885
Event: 23rd Annual Technical Symposium, 1979, San Diego, United States

Abstract

The infrared scanning optical system to be considered is an 8 to 11. 5Ã‚Âµm dual-field-of-view configuration. With production, the ultimate goal of such a system--a cost-effective, productioncompatible design--assembly and alignment methodology is imperative. The optical design approach of previous configurations was modified so as to provide a modular system whereby preassembled, aligned, and tested modules can be "bolted together" and, with a minimum of adjustments, yield an acceptable level of performance. This paper discusses many of the optomechanical design tradeoffs which lead to a final modular system design. Module assembly, alignment, and test methodology are discussed.

Citation Download Citation

Robert E. Fischer "Modular Design/Assembly/Alignment Approach To An Infrared (IR) Scanning System", Proc. SPIE 0193, Optical Systems in Engineering I, (29 November 1979); https://doi.org/10.1117/12.957885

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