Paper
15 September 1993 Effects of space-radiation damage and temperature on CCD noise for the Lyman FUSE mission
Author Affiliations +
Abstract
Charge coupled device (CCD) imaging arrays are becoming more frequently used in space vehicles and equipment, especially space-based astronomical telescopes. It is important to understand the effects of radiation on a CCD so that its performance degradation during mission lifetime can be predicted, and so that methods to prevent unacceptable performance degradation can be found. Much recent work by various groups has focused on the problems surrounding the loss of charge transfer efficiency and the increase in dark current and dark current spikes in CCDs. The use of a CCD as the fine error sensor in the Lyman Far Ultraviolet Spectroscopic Explorer (FUSE) is limited by its noise performance. In this work we attempt to understand some of the factors surrounding the noise degradation due to radiation in a space environment. Later, we demonstrate how low frequency noise can be used as a characterization tool for studying proton radiation damage in CCDs.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard G. Murowinski, Linzhuang Gao, and M. Jamal Deen "Effects of space-radiation damage and temperature on CCD noise for the Lyman FUSE mission", Proc. SPIE 1953, Photonics for Space Environments, (15 September 1993); https://doi.org/10.1117/12.156564
Lens.org Logo
CITATIONS
Cited by 8 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Charge-coupled devices

Transistors

Radiation effects

CCD image sensors

Silicon

Field effect transistors

Interfaces

RELATED CONTENT

Technology of large focal planes of CCDs
Proceedings of SPIE (January 12 2004)
Flash Technology for CCD Imaging in the UV
Proceedings of SPIE (December 10 1986)
Thermal design for the Advanced Camera for Surveys
Proceedings of SPIE (August 28 1998)
Results of a fast pnCCD detector system
Proceedings of SPIE (August 25 2005)
MOS CCDs for the wide field imager on the XEUS...
Proceedings of SPIE (August 18 2005)

Back to Top