Control of residual chromatic aberration levels in infrared microscope objective designs

Christopher Carl Alexay

doi:10.1117/12.155834

10 August 1993 Control of residual chromatic aberration levels in infrared microscope objective designs

Christopher Carl Alexay

Proceedings Volume 1970, Systems-Oriented Optical Design; (1993) https://doi.org/10.1117/12.155834
Event: Optical Engineering and Photonics in Aerospace Sensing, 1993, Orlando, FL, United States

Abstract

The field of infrared micro-spectroscopy chiefly utilizes reflective objective designs due to the broad spectral ranges over which they operate. Some disadvantages of this design methodology are briefly discussed. A technique for the identification of complimentary materials best suited for enhanced achromatic performance over broad spectral regions in the infrared is investigated. This technique is applied to the task of designing refractive microscope objectives capable of diffraction limited performance over the 0.8 (mu) to 12 (mu) spectral range.

Citation Download Citation

Christopher Carl Alexay "Control of residual chromatic aberration levels in infrared microscope objective designs", Proc. SPIE 1970, Systems-Oriented Optical Design, (10 August 1993); https://doi.org/10.1117/12.155834

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available