Paper
1 April 1993 Detecting defects and showing their position in a deep hole by means of CCD camera
Muxing Liu, Zhenying Liu, Qian Mi, Binghua Su
Author Affiliations +
Proceedings Volume 1982, Photoelectronic Detection and Imaging: Technology and Applications '93; (1993) https://doi.org/10.1117/12.142040
Event: Photoelectronic Detection and Imaging: Technology and Applications '93, 1993, Beijing, China
Abstract
The small, put-in, optical testing head described in the paper is available to detect the inner surface defects in a deep hole. It is composed of the following advanced techniques: CCD camera, step motor, grating displacement measurement unit, etc. It can be put in a hole thats diameter is larger than 40 mm and can scan in axial and diametrical directions, recording the image by intermittent CCD camera. The detecting position and image data can be memorized by computer to analyze and process. The resolution of the testing head is better than 0.04 mm.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Muxing Liu, Zhenying Liu, Qian Mi, and Binghua Su "Detecting defects and showing their position in a deep hole by means of CCD camera", Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); https://doi.org/10.1117/12.142040
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Cited by 1 scholarly publication.
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KEYWORDS
Head

Imaging systems

Cameras

CCD cameras

Image processing

Defect detection

Mirrors

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