Electron scrubbing of microchannel plates

Xuhui Zhou; Shicai Liu; D. Chen; Zonghe Xu

doi:10.1117/12.142072

1 April 1993 Electron scrubbing of microchannel plates

Xuhui Zhou, Shicai Liu, D. Chen, Zonghe Xu

Proceedings Volume 1982, Photoelectronic Detection and Imaging: Technology and Applications '93; (1993) https://doi.org/10.1117/12.142072
Event: Photoelectronic Detection and Imaging: Technology and Applications '93, 1993, Beijing, China

Abstract

In this paper the electron scrubbing and life tests for microchannel plates used in second generation image intensifiers are studied. It presents the test apparatus developed specially for such tests and inquires into the proper schemes for the scrubbing process. Test results are analyzed and relevant conclusions drawn.

Citation Download Citation

Xuhui Zhou, Shicai Liu, D. Chen, and Zonghe Xu "Electron scrubbing of microchannel plates", Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); https://doi.org/10.1117/12.142072

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