Photoelectronic detection of optical surface defects of optical system

Shou-Cheng Cheng; Fu Wang

doi:10.1117/12.142032

1 April 1993 Photoelectronic detection of optical surface defects of optical system

Shou-Cheng Cheng, Fu Wang

Proceedings Volume 1982, Photoelectronic Detection and Imaging: Technology and Applications '93; (1993) https://doi.org/10.1117/12.142032
Event: Photoelectronic Detection and Imaging: Technology and Applications '93, 1993, Beijing, China

Abstract

This paper introduces an auto-photoelectronic instrument for evaluating the surface defects of the optical parts inside an optical instrument. By analyzing the effects of defects on image quality, we can present the possibility of evaluating the surface defects and its damage objectively and quantitatively by measuring stray-light. Detailed discussion is given about the physical procedure for generating and measuring stray-light. On the basis of this theoretical research a new type of auto-photoelectronic instrument used to evaluate the defects on the optical surface inside the optical system is given. In this instrument the technology of photoelectronics and microcomputer is applied, so a test result is given automatically.

Citation Download Citation

Shou-Cheng Cheng and Fu Wang "Photoelectronic detection of optical surface defects of optical system", Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); https://doi.org/10.1117/12.142032

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