Characterization of a large format CCD array

Zoran Ninkov; Brian S. Backer; David Bretz; Peter D. Burns

doi:10.1117/12.165185

29 December 1993 Characterization of a large format CCD array

Zoran Ninkov, Brian S. Backer, David Bretz, Peter D. Burns

Proceedings Volume 1987, Recording Systems: High-Resolution Cameras and Recording Devices and Laser Scanning and Recording Systems; (1993) https://doi.org/10.1117/12.165185
Event: Electronic Imaging Device Engineering, 1993, Munich, Germany

Abstract

A study has been made of some of the factors affecting the quality of the recorded image when using a large format 2K X 2K Kodak CCD imager. The optimal means for removing the dc offset, often referred to as the bias, is to sample many such frames and take a median at each pixel. The effects of external noise from electronics and cosmic rays are then removed well. The remaining noise in the frame appears to have a Gaussian form. The effect of pixels that accumulate signal due to a high thermal current can be significantly reduced by cooling. To remove the non-uniformity across the array due to the variation in responsivity from pixel to pixel it is extremely important to acquire images of uniform fields at the wavelength at which the observations of interest were made. This is especially important when image acquisition is over wavelength ranges outside the normal visual. For highly accurate photometric applications residual image effects needed to be considered.

Citation Download Citation

Zoran Ninkov, Brian S. Backer, David Bretz, and Peter D. Burns "Characterization of a large format CCD array", Proc. SPIE 1987, Recording Systems: High-Resolution Cameras and Recording Devices and Laser Scanning and Recording Systems, (29 December 1993); https://doi.org/10.1117/12.165185

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