Evaluation of machine vision systems for six-sigma environment

Peter Cencik

doi:10.1117/12.164890

17 December 1993 Evaluation of machine vision systems for six-sigma environment

Peter Cencik

Proceedings Volume 1989, Computer Vision for Industry; (1993) https://doi.org/10.1117/12.164890
Event: Electronic Imaging Device Engineering, 1993, Munich, Germany

Abstract

Machine vision systems are often used in gaging applications. Analysis of the measurement system is important to determine if the measurement process is adequate to measure the part- to-part variability in the manufacturing process and if the system can be implemented as a reject station. The paper provides the principles of measurement system analysis and the principles of Three-Sigma and Six-Sigma quality control. This paper introduces formulas for evaluating the additional yield loss due to rejection of good parts in Three-Sigma and Six- Sigma process design as function of the measurement system resolution. At the end of the paper we will discuss gage resolution requirements for Three-Sigma and Six-Sigma quality control.

Citation Download Citation

Peter Cencik "Evaluation of machine vision systems for six-sigma environment", Proc. SPIE 1989, Computer Vision for Industry, (17 December 1993); https://doi.org/10.1117/12.164890

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