Phase stepping: application to high-resolution moire

Yves Surrel; Bing Zhao

doi:10.1117/12.165449

10 December 1993 Phase stepping: application to high-resolution moire

Yves Surrel, Bing Zhao

Proceedings Volume 2003, Interferometry VI: Techniques and Analysis; (1993) https://doi.org/10.1117/12.165449
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

The application of phase-stepping to moire is presented. An analysis of the precision attainable with this technique shows that a resolution comparable to that of strain gauges is possible. We present preliminary experimental results from computer aided processing of phase-shifted moire fringe patterns (software FRANGYNE developed in our laboratory). Although this software is not specific, only results from in-plane moire are presented. Our moire setup consists of a CCD camera whose sensor acts as the reference grid. The phase shift is obtained by translating the camera perpendicular to the optical axis. The experimental results concern isotropic and anisotropic materials, and show the potential interest of such a technique in the field of experimental mechanics.

Citation Download Citation

Yves Surrel and Bing Zhao "Phase stepping: application to high-resolution moire", Proc. SPIE 2003, Interferometry VI: Techniques and Analysis, (10 December 1993); https://doi.org/10.1117/12.165449

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