Diagnosis of plasma in CCD damage process induced by laser

Xiao-Wu Ni; Jian Lu; Anzhi He

doi:10.1117/12.163710

2 December 1993 Diagnosis of plasma in CCD damage process induced by laser

Xiao-Wu Ni, Jian Lu, Anzhi He

Proceedings Volume 2005, Optical Diagnostics in Fluid and Thermal Flow; (1993) https://doi.org/10.1117/12.163710
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

In this paper, we used shapes of plasmas, which a Q-switched YAG laser acted repeatedly upon a CCD having MOS structure to produce, to investigate the destroying process of the optoelectronic device, and first obtained related experimental results of CCD to be destroyed by a 1.06 micrometers laser beam with a pulse width of 15 ns.

Citation Download Citation

Xiao-Wu Ni, Jian Lu, and Anzhi He "Diagnosis of plasma in CCD damage process induced by laser", Proc. SPIE 2005, Optical Diagnostics in Fluid and Thermal Flow, (2 December 1993); https://doi.org/10.1117/12.163710

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