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16 December 1993 Characterization of polycrystalline phosphors for area x-ray detectors
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Abstract
Incorporation of polycrystalline phosphor screens into efficient, high precision x-ray detectors requires an understanding of the subtleties of x-ray capture and subsequent light transmission in the screen, as well as an awareness of how phosphors affect detector calibration. We discuss the preparation of such phosphor screens and their characterization with respect to efficiency, stopping power, spatial resolution, decay time, and spectral output.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sol M. Gruner, Sandor L. Barna, Michael E. Wall, Mark W. Tate, and Eric F. Eikenberry "Characterization of polycrystalline phosphors for area x-ray detectors", Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); https://doi.org/10.1117/12.164729
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