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4 December 1979 Optical Pattern Recognition And Classification Invariant To Selectable Pattern Features
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Abstract
A coherent optical method of performing pattern recognition has been studied which is invariant to selectable pattern features. Two examples of pattern features frequently encountered in pattern recognition tasks are scale and rotation. A recognition scheme which is invariant to these features is able to detect an object independent of its size and angular orientation. In our case, the recognition scheme not only is invariant to these specific features, but can also be used to measure them.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. R. Leger and S. H. Lee "Optical Pattern Recognition And Classification Invariant To Selectable Pattern Features", Proc. SPIE 0201, Optical Pattern Recognition, (4 December 1979); https://doi.org/10.1117/12.965620
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