Measurement of multilayer reflectivities from 8 keV to 130 keV

Peter Hoghoj; Karsten Dan Joensen; Finn Erland Christensen; Jean Susini; Eric Ziegler; Andreas K. Freund; E. Lueken; Christian Riekel

doi:10.1117/12.167237

1 February 1994 Measurement of multilayer reflectivities from 8 keV to 130 keV

Peter Hoghoj, Karsten Dan Joensen, Finn Erland Christensen, Jean Susini, Eric Ziegler, Andreas K. Freund, E. Lueken, Christian Riekel

Author Affiliations +

Proceedings Volume 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II; (1994) https://doi.org/10.1117/12.167237
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

This paper presents measurements of specular and non-specular reflectivities of a W/Si multilayer with period d equals 135.1 angstroms. Angular dispersive measurements were performed at 8.05 keV and 59.3 keV, while energy dispersive measurements were made in the range of 17 keV to 130 keV. At an incidence angle of 1.57 mrad the fourth order Bragg- reflection is found at an energy of 125 keV with a reflectivity in excess of 50% and a bandwidth (FWHM) of 3%.

Citation Download Citation

Peter Hoghoj, Karsten Dan Joensen, Finn Erland Christensen, Jean Susini, Eric Ziegler, Andreas K. Freund, E. Lueken, and Christian Riekel "Measurement of multilayer reflectivities from 8 keV to 130 keV", Proc. SPIE 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II, (1 February 1994); https://doi.org/10.1117/12.167237

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