Multilayered supermirror structures for hard x-ray synchrotron and astrophysics instrumentation

Karsten Dan Joensen; Peter Hoghoj; Finn Erland Christensen; Paul Gorenstein; Jean Susini; Eric Ziegler; Andreas K. Freund; James L. Wood

doi:10.1117/12.167210

1 February 1994 Multilayered supermirror structures for hard x-ray synchrotron and astrophysics instrumentation

Karsten Dan Joensen, Peter Hoghoj, Finn Erland Christensen, Paul Gorenstein, Jean Susini, Eric Ziegler, Andreas K. Freund, James L. Wood

Author Affiliations +

Proceedings Volume 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II; (1994) https://doi.org/10.1117/12.167210
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

By varying the thickness of the layers in a multilayer down through the structure, it is possible to produce wide-band reflectors. We report measurements and modeling of the reflectivity of Ni/C, Mo/Si and W/Si supermirrors, at energies ranging from 8 to 130 keV, and discuss the performance of two possible applications: a Kirkpatrick-Baez telescope, and a multiwavelength hard X-ray focusing reflector. The supermirrors perform as expected, and model-fits over the full range have been attempted with some success. We conclude that the supermirror coatings do indeed look very promising as hard x-ray optics for synchrotron applications, while some work on highly nested structures and supermirror coatings on very thin large substrates is necessary, before the feasibility of employing large-area supermirrors for hard X-ray astronomy is determined.

Citation Download Citation

Karsten Dan Joensen, Peter Hoghoj, Finn Erland Christensen, Paul Gorenstein, Jean Susini, Eric Ziegler, Andreas K. Freund, and James L. Wood "Multilayered supermirror structures for hard x-ray synchrotron and astrophysics instrumentation", Proc. SPIE 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II, (1 February 1994); https://doi.org/10.1117/12.167210

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