Robust fractal characterization of 1D and 2D signals

Niranjan Avadhanam; Sunanda Mitra

doi:10.1117/12.162041

29 October 1993 Robust fractal characterization of 1D and 2D signals

Niranjan Avadhanam, Sunanda Mitra

Proceedings Volume 2032, Neural and Stochastic Methods in Image and Signal Processing II; (1993) https://doi.org/10.1117/12.162041
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

Fractal characterization of signals is well suited in analysis of some time series data and in classification of natural shapes and textures. A maximum likelihood estimator is used to measure the parameter H which is directly related to the fractal dimension. The robustness of the estimator and the performance of the method are demonstrated on datasets generated using a variety of techniques. Finally the characterization is used in segmentation of composite images of natural textures.

Citation Download Citation

Niranjan Avadhanam and Sunanda Mitra "Robust fractal characterization of 1D and 2D signals", Proc. SPIE 2032, Neural and Stochastic Methods in Image and Signal Processing II, (29 October 1993); https://doi.org/10.1117/12.162041

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