Performance of charge-coupled devices in digital shearography

Tuck Wah Ng; Fook Siong Chau

doi:10.1117/12.162108

22 October 1993 Performance of charge-coupled devices in digital shearography

Tuck Wah Ng, Fook Siong Chau

Proceedings Volume 2066, Industrial Optical Sensing and Metrology: Applications and Integration; (1993) https://doi.org/10.1117/12.162108
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States

Abstract

The use of charge-coupled devices (CCDs) for imaging in digital shearography necessitates the knowledge of their electronic (signal-independent) noise level, as the visibility of fringes produced is dependent on this factor. A method based on measuring the experimental CCD noise variance to construct a linear equation system is presented. From the solution of this equation system, the electronic noise level of a particular CCD used for imaging can be determined. Evaluation of CCDs based on this noise factor allows the performance of each CCD used in digital shearography to be compared.

Citation Download Citation

Tuck Wah Ng and Fook Siong Chau "Performance of charge-coupled devices in digital shearography", Proc. SPIE 2066, Industrial Optical Sensing and Metrology: Applications and Integration, (22 October 1993); https://doi.org/10.1117/12.162108

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