To scale or not to scale

Arthur H. Guenther; John K. McIver

doi:10.1117/12.180899

28 July 1994 To scale or not to scale

Arthur H. Guenther, John K. McIver

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Proceedings Volume 2114, Laser-Induced Damage in Optical Materials: 1993; (1994) https://doi.org/10.1117/12.180899
Event: Laser-Induced Damage in Optical Materials: 1993, 1993, Boulder, CO, United States

Abstract

Herein is reviewed the utility of scaling relations and pitfalls to be avoided in their application. This is illustrated by recourse to a discussion of selected proposed scaling relationships including their range of validity, experimental foundation and efficacy in determining the basis of fundamental physical interaction processes. The latter is illustrated using the scaling of damage threshold with the duration of an incident laser pulse. It is shown that for a defect dominated pulsed laser interaction mechanism, the pulse length scaling dependence can change over a narrow range due to a variation of the characteristics of the defect which is most sensitive or easiest to damage under the experimental conditions of import even though the gross aspects of the interaction mechanism do not change appreciably.

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Arthur H. Guenther and John K. McIver "To scale or not to scale", Proc. SPIE 2114, Laser-Induced Damage in Optical Materials: 1993, (28 July 1994); https://doi.org/10.1117/12.180899

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