Photocarrier diffusion at a Si(111) surface studied by reflective two-color transient grating scattering

C. M. Li; Z. Charles Ying; Theodore A. Sjodin; Hai-Lung Dai

doi:10.1117/12.180864

21 July 1994 Photocarrier diffusion at a Si(111) surface studied by reflective two-color transient grating scattering

C. M. Li, Z. Charles Ying, Theodore A. Sjodin, Hai-Lung Dai

Proceedings Volume 2125, Laser Techniques for Surface Science; (1994) https://doi.org/10.1117/12.180864
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

The dynamics of photocarrier diffusion was studied by a two color transient grating technique in reflection geometry. A single exponential decay feature was observed immediately following the electron excitation pulse and was attributed to band edge carrier diffusion.

Citation Download Citation

C. M. Li, Z. Charles Ying, Theodore A. Sjodin, and Hai-Lung Dai "Photocarrier diffusion at a Si(111) surface studied by reflective two-color transient grating scattering", Proc. SPIE 2125, Laser Techniques for Surface Science, (21 July 1994); https://doi.org/10.1117/12.180864

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available