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11 May 1994 Measurement and simulation of photoluminescence spectra from vertical-cavity quantum-well laser structures
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Proceedings Volume 2139, Quantum Well and Superlattice Physics V; (1994)
Event: OE/LASE '94, 1994, Los Angeles, CA, United States
We compare photoluminescence data collected in either a surface-normal configuration (NPL) or with the pump and collection paths perpendicular to a cross-section of the epitaxial layers (XPL) for various vertical-cavity surface-emitting lasers and distributed quantum well structures. We report the spatial resolution of the XPL technique, particularly as it applies to distinguishing features in complex multilayer structures. We assess a potential simulation method for transforming the perturbed NPL spectra into the unperturbed XPL spectra, taking into account a number of experimental and material parameters which may influence the lineshape. These factors include the pump field distribution and its influence on the weighting of the emitters, the collection optics, and the changes in the dispersive complex dielectric constant of the quantum wells. This information is of import not only to optimizing device manufacture, but to basic physical and materials research as well. Whereas the XPL technique is a relatively simple but destructive characterization tool, a complete understanding of NPL emission could be made to yield the same information via rapid, nondestructive means.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David T. Schaafsma, Robert K. Hickernell, and David H. Christensen "Measurement and simulation of photoluminescence spectra from vertical-cavity quantum-well laser structures", Proc. SPIE 2139, Quantum Well and Superlattice Physics V, (11 May 1994);

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