Parallel processing multitemperature robotic tester and burn-in oven for InGaAsP lasers

Michael A. Gazier; Ming Leung; Ed Cremer; Dave Hess; Frank Volkmer

doi:10.1117/12.176644

1 June 1994 Parallel processing multitemperature robotic tester and burn-in oven for InGaAsP lasers

Michael A. Gazier, Ming Leung, Ed Cremer, Dave Hess, Frank Volkmer

Proceedings Volume 2148, Laser Diode Technology and Applications VI; (1994) https://doi.org/10.1117/12.176644
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

Coolerless lasers meeting Bellcore technical advisory TA-TSY-000983 are needed for access applications. To this end, a parallel processing multi-temperature robotic tester (MTRT) for high volume dc characterization of semiconductor lasers over the temperature range -40 degree(s)C to +85 degree(s)C is presented. The cartridge based system is fully integrated with the device burn-in oven, allowing for automated testing and handling. The robot picks devices from a cartridge and places them in one of seven test pods, each independently temperature controlled and serviced by a stage with a photodetector, movable polarizer, and a fiber. The test pods measure dc, pulsed, polarized and non-polarized L/Is, V/Is, and optical spectrums of the devices at each temperature. The test software is multi- threaded and includes a custom task scheduler and mailbox system. This C software is three- tiered with a user-interface process, a test system process, and a database link process. All test specifications, device specifications, and device data are acquired from and stored back onto a remote database for data analysis and reporting. The database is also accessed via a 4GL user- friendly interface. An independent cartridge-based burn-in performs the automatic current control (ACC) burn-in cycles between tests and integrates into the robotic test system equipment. Together, the robot and the burn-in oven perform all process steps required between the post-bond and final test manufacturing stages.

Citation Download Citation

Michael A. Gazier, Ming Leung, Ed Cremer, Dave Hess, and Frank Volkmer "Parallel processing multitemperature robotic tester and burn-in oven for InGaAsP lasers", Proc. SPIE 2148, Laser Diode Technology and Applications VI, (1 June 1994); https://doi.org/10.1117/12.176644

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KEYWORDS

Databases

Manufacturing

Robotics

Control systems

Sensors

Electronics

Human-machine interfaces

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