Wafer scale testing of vertical cavity surface-emitting laser arrays

Thaddeus G. Dziura; S. C. Wang

doi:10.1117/12.176642

1 June 1994 Wafer scale testing of vertical cavity surface-emitting laser arrays

Thaddeus G. Dziura, S. C. Wang

Proceedings Volume 2148, Laser Diode Technology and Applications VI; (1994) https://doi.org/10.1117/12.176642
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

We have applied automated wafer scale testing methods to the characterization of arrays of vertical cavity surface emitting semiconductor lasers. The hardware and software for recording light versus current, current versus voltage, optical spectra, and high speed modulation performance are described.

Citation Download Citation

Thaddeus G. Dziura and S. C. Wang "Wafer scale testing of vertical cavity surface-emitting laser arrays", Proc. SPIE 2148, Laser Diode Technology and Applications VI, (1 June 1994); https://doi.org/10.1117/12.176642

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