Modern high-speed measurement techniques

Brian H. Kolner

doi:10.1117/12.175248

2 May 1994 Modern high-speed measurement techniques

Brian H. Kolner

Proceedings Volume 2149, Technologies for Optical Fiber Communications; (1994) https://doi.org/10.1117/12.175248
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

Today's high-speed electronic devices and networks challenge the capabilities of commercially available test instrumentation. Modern techniques using ultrashort light pulses and electron beams are now routinely used to characterize these fast circuits but are not without their limitations. In this paper I discuss the performance characteristics common to all these measurement techniques and compare some of them in a context that will be applicable to future techniques as they develop.

Citation Download Citation

Brian H. Kolner "Modern high-speed measurement techniques", Proc. SPIE 2149, Technologies for Optical Fiber Communications, (2 May 1994); https://doi.org/10.1117/12.175248

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